SIMPLE ELECTRONIC SPECKLE-SHEARING-PATTERN INTERFEROMETER

被引：30

作者：

JOENATHAN, C

TORROBA, R

机构：

[1] Rose Hulman Institute of Technology, Department of Applied Optics and Physics, Terre Haute, IN, 47803

[2] Centro de Investigaciones Opticas, La Plata, 1900

来源：

OPTICS LETTERS | 1990年 / 15卷 / 20期

关键词：

D O I：

10.1364/OL.15.001159

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A simple electronic speckle-shearing-pattern interferometer, in which the image of an object is focused and sheared with a split lens onto a diffuser, is described. The sheared images on the diffuser are focused by a television camera and then digitized and processed in a host computer. The results obtained for two basic types of shearing, lateral and radial, are presented. © 1990 Optical Society of America.

引用

页码：1159 / 1161

页数：3

共 9 条

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