A SIMPLE METHOD TO DETERMINE THE STEP HEIGHTS ON ULTRATHIN HETEROEPITAXIAL FILMS

被引:11
作者
LIEW, YF
HE, YL
CHAN, A
WANG, GC
机构
[1] Department of Physics Rensselaer Polytechnic Institute, Troy
关键词
D O I
10.1016/0039-6028(92)90057-D
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The step heights or first interlayer spacings on ultrathin heteroepitaxial films of Fe on Au(001) have been determined from the energy-dependent angular profiles of the specular diffraction beam obtained from low energy electron diffraction (LEED). This method requires little effort in calculation and can be used as a guide in the widely used dynamical LEED calculation of the energy-dependent peak intensity. It is also very general and can be applied to other ultrathin heteroepitaxial films as long as the scattering factors of constituent atoms have slow varying phases relative to the phase change due to step height in the low energy regime.
引用
收藏
页码:L461 / L466
页数:6
相关论文
共 45 条
[1]  
ARNOTT M, 1988, VACUUM, V38, P273
[2]   ORDERED NUCLEATION OF NI AND AU ISLANDS ON AU(111) STUDIED BY SCANNING TUNNELING MICROSCOPY [J].
CHAMBLISS, DD ;
WILSON, RJ ;
CHIANG, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :933-937
[3]  
CLARKE A, 1987, SURF SCI, V192, pL843, DOI 10.1016/S0039-6028(87)81155-X
[4]   X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD-SCATTERING STUDIES OF LATTICE EXPANSIONS AND CONTRACTIONS IN EPITAXIAL-FILMS [J].
EGELHOFF, WF ;
JACOB, I ;
RUDD, JM ;
COCHRAN, JF ;
HEINRICH, B .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (03) :1582-1586
[5]   X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING - A NEW TOOL FOR SURFACE CRYSTALLOGRAPHY [J].
EGELHOFF, WF .
CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1990, 16 (03) :213-235
[6]  
FINNIS MW, 1974, J PHYS F MET PHYS, V4, P7
[7]   STRUCTURE AND PHASES OF THE AU(001) SURFACE - INPLANE STRUCTURE [J].
GIBBS, D ;
OCKO, BM ;
ZEHNER, DM ;
MOCHRIE, SGJ .
PHYSICAL REVIEW B, 1990, 42 (12) :7330-7344
[8]   EPITAXY OF SI(111) AS STUDIED WITH A NEW HIGH RESOLVING LEED SYSTEM [J].
GRONWALD, KD ;
HENZLER, M .
SURFACE SCIENCE, 1982, 117 (1-3) :180-187
[9]  
Heinz T., 1995, LOW ENERGY ELECTRON, V14, P1421
[10]   LEED-INVESTIGATION OF STEP ARRAYS ON CLEAVED GERMANIUM (111) SURFACES [J].
HENZLER, M .
SURFACE SCIENCE, 1970, 19 (01) :159-&