SUBMICRON PROBE OF POLYMER ADHESION WITH ATOMIC FORCE MICROSCOPY - DEPENDENCE ON TOPOGRAPHY AND MATERIAL INHOMOGENEITIES

We have used the atomic force microscope as a nanoindenter to both doped and undoped polycarbonate to probe the dependence of adhesion on topography and material inhomogeneities. Adhesion measurements at the same position are repeatable to 2%. The magnitude of the adhesion is found to decrease as the local curvature on the surface increases. Spatial adhesion maps of doped polymers show structure that is not apparent in surface topography. The spatial resolution of the measurement is at least 300 angstrom.