CONFOCAL SURFACE ACOUSTIC-WAVE MICROSCOPY

被引：19

作者：

SMITH, IR ^{[1
]}

WICKRAMASINGHE, HK ^{[1
]}

FARNELL, GW ^{[1
]}

JEN, CK ^{[1
]}

机构：

[1] MCGILL UNIV,DEPT ELECTR ENGN,MONTREAL H4C 2K3,QUEBEC,CANADA

来源：

APPLIED PHYSICS LETTERS | 1983年 / 42卷 / 05期

关键词：

D O I：

10.1063/1.93958

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：411 / 413

页数：3

共 11 条

[1] PLANAR ACOUSTIC MICROSCOPE LENS USING RAYLEIGH TO COMPRESSIONAL CONVERSION [J].

FARNELL, GW ;

JEN, CK .

ELECTRONICS LETTERS, 1980, 16 (14) :541-543

[2] PRECISION-MEASUREMENT OF RAYLEIGH-WAVE VELOCITY PERTURBATION [J].

LIANG, K ;

BENNETT, SD ;

KHURIYAKUB, BT ;

KINO, GS .

APPLIED PHYSICS LETTERS, 1982, 41 (12) :1124-1126

[3] RAY INTERPRETATION OF THE MATERIAL SIGNATURE IN THE ACOUSTIC MICROSCOPE [J].

PARMON, W ;

BERTONI, HL .

ELECTRONICS LETTERS, 1979, 15 (21) :684-686

[4] ACOUSTIC MICROSCOPY WITH MECHANICAL SCANNING - REVIEW [J].

QUATE, CF ;

ATALAR, A ;

WICKRAMASINGHE, HK .

PROCEEDINGS OF THE IEEE, 1979, 67 (08) :1092-1114

[5] DIFFERENTIAL PHASE-CONTRAST IN THE ACOUSTIC MICROSCOPE [J].

SMITH, IR ;

WICKRAMASINGHE, HK .

ELECTRONICS LETTERS, 1982, 18 (02) :92-94

[6]

SMITH IR, 1981, ACOUST IMAGING, V10, P779

[7]

SMITH IR, ELECTRON LETT

[8]

SMITH IR, 1981, 1981 P ULTR S CHIC, P591

[9] RAYLEIGH-WAVE ABSORPTION VIA ACOUSTIC MICROSCOPY [J].

WEGLEIN, RD .

ELECTRONICS LETTERS, 1982, 18 (01) :20-21

[10] ANALYSIS OF SAW ATTENUATION MEASUREMENT USING ACOUSTIC MICROSCOPY [J].

YAMANAKA, K .

ELECTRONICS LETTERS, 1982, 18 (14) :587-589

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