ANGULAR-DISTRIBUTION MEASUREMENTS OF SPUTTERED ATOMS WITH CHARACTERISTIC X-RAY-EMISSION

被引：33

作者：

RODELSPERGER, K ^{[1
]}

SCHARMANN, A ^{[1
]}

机构：

[1] JUSTUS LIEBIG UNIV,INST PHYS 1,GIESSEN,BUNDES REPUBLIK

来源：

NUCLEAR INSTRUMENTS & METHODS | 1976年 / 132卷 / JAN-F期

关键词：

D O I：

10.1016/0029-554X(76)90758-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：355 / 362

页数：8

共 15 条

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