STUDY OF THE CRYSTALLIZATION OF ANTIMONY THIN-FILMS BY TRANSMISSION ELECTRON-MICROSCOPY OBSERVATIONS AND ELECTRICAL MEASUREMENTS

被引：18

作者：

HOAREAU, A

HU, JX

JENSEN, P

MELINON, P

TREILLEUX, M

CABAUD, B

机构：

[1] Département de Physique des Matériaux, Université Claude Bernard Lyon-1, F-69622 Villeurbanne Cedex, 43 Bd. du

来源：

THIN SOLID FILMS | 1992年 / 209卷 / 02期

关键词：

D O I：

10.1016/0040-6090(92)90669-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have correlated electrical measurements and transmission electron microscopy observations of ultrathin antimony films. The obtained results allow us to understand the crystallization of antimony. It seems that, at room temperature, the critical thickness below which no complete crystallization is possible corresponds to the percolation threshold.

引用

页码：161 / 164

页数：4

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