P-POLARIZED REFLECTANCES FOR TRANSPARENT THIN FILMS ON TRANSPARENT SUBSTRATES

[1] Baumeister P., 1961, OPT ACTA, V8, P105, DOI 10.1080/713826378

[2] BORN M, 1959, PRINCIPLES OPTICS, P42

[3] CATALAN L, 1964, REV OPT THEOR INSTR, V43, P499

[4] SOME COMPUTED OPTICAL PROPERTIES OF ANTIREFLECTION COATINGS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (04) : 437 - &

[5] CATALAN LA, 1961, BRIT J APPL PHYS, V12, P499

[6] DETERMINATION OF REFRACTIVE INDEX OF THIN DIELECTRIC FILMS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (02) : 198 - &

[7] POHLACK H, 1952, JENAER JB 1952, P103

[8] SCHUSTER K, 1949, ANN PHYS-BERLIN, V4, P352

[9] BREWSTER ANGLE APPARATUS FOR THIN FILM INDEX MEASUREMENTS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (01) : 62 - 64

[10] TURBADAR T, 1964, OPT ACTA, V11, P159

[1] Baumeister P., 1961, OPT ACTA, V8, P105, DOI 10.1080/713826378

[2] BORN M, 1959, PRINCIPLES OPTICS, P42

[3] CATALAN L, 1964, REV OPT THEOR INSTR, V43, P499

[4] SOME COMPUTED OPTICAL PROPERTIES OF ANTIREFLECTION COATINGS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (04) : 437 - &

[5] CATALAN LA, 1961, BRIT J APPL PHYS, V12, P499

[6] DETERMINATION OF REFRACTIVE INDEX OF THIN DIELECTRIC FILMS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (02) : 198 - &

[7] POHLACK H, 1952, JENAER JB 1952, P103

[8] SCHUSTER K, 1949, ANN PHYS-BERLIN, V4, P352

[9] BREWSTER ANGLE APPARATUS FOR THIN FILM INDEX MEASUREMENTS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (01) : 62 - 64

[10] TURBADAR T, 1964, OPT ACTA, V11, P159