ATOMIC GEOMETRIES OF THE (110) SURFACES OF III-V-COMPOUND SEMICONDUCTORS - DETERMINATION BY TOTAL-ENERGY MINIMIZATION AND ELASTIC LOW-ENERGY ELECTRON-DIFFRACTION

被引：20

作者：

DUKE, CB

MAILHIOT, C

PATON, A

CHADI, DJ

KAHN, A

机构：

[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

[2] PRINCETON UNIV,DEPT ELECT ENGN & COMP SCI,PRINCETON,NJ 08544

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1985年 / 3卷 / 04期

关键词：

D O I：

10.1116/1.583057

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1087 / 1088

页数：2

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