DETERMINATION OF THE SIGN OF A DISLOCATION IN A ZNTE CRYSTAL BY CONVERGENT-BEAM ELECTRON-DIFFRACTION

被引:11
作者
NIU, F
WANG, R
LU, G
机构
来源
ACTA CRYSTALLOGRAPHICA SECTION A | 1991年 / 47卷
关键词
D O I
10.1107/S0108767390009795
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The twist and distortion of diffraction fringes in a convergent-beam electron diffraction pattern, caused by a dislocation in a ZnTe crystal, have been studied systematically. It has been found that the sense of such a twist reverses when the beam crossover changes from one side of the specimen to the other. From a qualitative consideration, it has been concluded that the diffraction fringes on the side pointed to by the vector u x c are shifted along b. This phenomenon can be used to determine the sign of the Burgers vector of a dislocation.
引用
收藏
页码:36 / 39
页数:4
相关论文
共 8 条
[1]   3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J].
CARPENTER, RW ;
SPENCE, JCH .
ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN) :55-&
[2]   ELECTRON-DIFFRACTION STUDIES OF STRAIN IN EPITAXIAL BICRYSTALS AND MULTILAYERS [J].
CHERNS, D ;
KIELY, CJ ;
PRESTON, AR .
ULTRAMICROSCOPY, 1988, 24 (04) :355-370
[3]  
CHERNS D, 1986, 11TH P INT C EL MICR, P721
[4]  
HIRSCH P, 1977, ELECTRON MICROS, P164
[5]  
JIAO S, 1987, J CHIN ELECTRON MICR, V6, P42
[6]   SIMULATION AND APPLICATION OF THE DISTORTED ZOLZ PATTERNS FROM DISLOCATIONS IN SI [J].
LU, G ;
WEN, JG ;
ZHANG, W ;
WANG, R .
ACTA CRYSTALLOGRAPHICA SECTION A, 1990, 46 :103-112
[7]  
TANAKA M, 1988, CONVERGENT BEAM ELEC, V2, P160
[8]   DISTORTION OF THE ZEROTH-ORDER LAUE-ZONE PATTERN CAUSED BY DISLOCATIONS IN A SILICON CRYSTAL [J].
WEN, JG ;
WANG, RH ;
LU, GH .
ACTA CRYSTALLOGRAPHICA SECTION A, 1989, 45 :422-427