SURFACE ENRICHMENT OF COPPER DUE TO KEV XE SPUTTERING OF AN AL-CU MIXTURE

[1] ANDERSEN HH, 1975, PHYSICS IONIZED GASE

[2] ANDERSEN N, 1974, K DAN VIDENSK SELSK, V39

[3] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41

[4] STRESS-INDUCED EFFECTS IN SPUTTERING AND SURFACE ANALYSIS [J]. APPLIED PHYSICS LETTERS, 1976, 28 (05) : 244 - 245

[5] EDWIN RP, 1973, J PHYS D, V6, P233

[6] THE PENETRATION OF POSITIVE IONS OF LOW ENERGY INTO ALLOYS AND COMPOSITION CHANGES PRODUCED IN THEM BY SPUTTERING [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 11 (1-2) : 55 - &

[7] HOWARD JK, 1976, ION BEAM SURFACE LAY, V1, P125

[8] Kelly R., 1973, Radiation Effects, V19, P39, DOI 10.1080/00337577308232213

[9] ROLE OF RECOIL IMPLANTATION IN ALTERING STOICHIOMETRY OF A BOMBARDED SOLID [J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 335 - 343

[10] FORMATION OF SECOND PHASE PARTICLES IN ALUMINUM-COPPER ALLOY FILMS [J]. THIN SOLID FILMS, 1972, 10 (03) : 377 - &

[1] ANDERSEN HH, 1975, PHYSICS IONIZED GASE

[2] ANDERSEN N, 1974, K DAN VIDENSK SELSK, V39

[3] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41

[4] STRESS-INDUCED EFFECTS IN SPUTTERING AND SURFACE ANALYSIS [J]. APPLIED PHYSICS LETTERS, 1976, 28 (05) : 244 - 245

[5] EDWIN RP, 1973, J PHYS D, V6, P233

[6] THE PENETRATION OF POSITIVE IONS OF LOW ENERGY INTO ALLOYS AND COMPOSITION CHANGES PRODUCED IN THEM BY SPUTTERING [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 11 (1-2) : 55 - &

[7] HOWARD JK, 1976, ION BEAM SURFACE LAY, V1, P125

[8] Kelly R., 1973, Radiation Effects, V19, P39, DOI 10.1080/00337577308232213

[9] ROLE OF RECOIL IMPLANTATION IN ALTERING STOICHIOMETRY OF A BOMBARDED SOLID [J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 335 - 343

[10] FORMATION OF SECOND PHASE PARTICLES IN ALUMINUM-COPPER ALLOY FILMS [J]. THIN SOLID FILMS, 1972, 10 (03) : 377 - &