SIMULTANEOUS ION-SCATTERING AND SECONDARY-ION MASS-SPECTROMETRY

被引：8

作者：

VASILE, MJ ^{[1
]}

MALM, DL ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1976年 / 21卷 / 1-2期

关键词：

D O I：

10.1016/0020-7381(76)80074-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：145 / 157

页数：13

共 12 条

[1]

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[2] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J].

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SURFACE SCIENCE, 1973, 35 (01) :427-457

[3] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J].

EVANS, CA .

ANALYTICAL CHEMISTRY, 1972, 44 (13) :A67-&

[4]

HONIG RE, 1974, ADV MASS SPECTROM, V6, P337

[5] SECONDARY ION MASS-SPECTROMETRY OF RARE-EARTH ELEMENTS [J].

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[6]

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[7] MULTILAYER CORROSION FILMS ON BIOGLASS SURFACES [J].

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CLARK, AE ;

HENCH, LL .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1974, 57 (09) :412-413

[8]

POATE JM, EXPT METHODS CATALYT

[9] SIMPLE, INEXPENSIVE SIMS APPARATUS [J].

SCHUBERT, R ;

TRACY, JC .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (04) :487-491

[10] SCATTERING OF LOW-ENERGY NOBLE GAS IONS FROM METAL SURFACES [J].

SMITH, DP .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (01) :340-+

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