SURFACE RECOMBINATION CURRENT WITH A NONIDEALITY FACTOR GREATER THAN 2

被引:16
作者
GHANNAM, MY
MERTENS, RP
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D O I
10.1109/55.31734
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:242 / 244
页数:3
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共 8 条
[1]  
Chen T. C., 1986, International Electron Devices Meeting 1986. Technical Digest (Cat. No.86CH2381-2), P650
[2]  
GHANNAM MY, 1985, THESIS KATHOLIEKE U
[3]   SURFACE EFFECTS ON P-N JUNCTIONS - CHARACTERISTICS OF SURFACE SPACE-CHARGE REGIONS UNDER NON-EQUILIBRIUM CONDITIONS [J].
GROVE, AS ;
FITZGERALD, DJ .
SOLID-STATE ELECTRONICS, 1966, 9 (08) :783-+
[4]  
HACKBARTH E, 1986, 44TH DEV RES C
[5]  
HILLEN MW, 1983, SOLID STATE ELECTRON, P453
[6]  
JOSHI SP, 1987, IEDM, P182
[7]   IDENTIFICATION AND IMPLICATION OF A PERIMETER TUNNELING CURRENT COMPONENT IN ADVANCED SELF-ALIGNED BIPOLAR-TRANSISTORS [J].
LI, GP ;
HACKBARTH, E ;
CHEN, TC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (01) :89-95
[8]   DEGRADATION OF BIPOLAR-TRANSISTORS UNDER HIGH-CURRENT STRESS AT 300-K [J].
WACHNIK, RA ;
BUCELOT, TJ ;
LI, GP .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (09) :4734-4740