APPLICATION OF LAYERED SYNTHETIC MICROSTRUCTURES TO HIGH-TEMPERATURE PLASMA DIAGNOSTICS

被引：5

作者：

DAY, RH ^{[1
]}

BARBEE, TW ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT MAT SCI & ENGN,STANFORD,CA 94305

来源：

关键词：

D O I：

10.1063/1.1138175

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：791 / 795

页数：5

共 9 条

[1]

Barbee Jr. T.W., 1981, AIP C P, V75, P131

[2]

Deubner W, 1930, ANN PHYS-BERLIN, V5, P261

[3]

GOLUB L, 1981, P SOC PHOTO-OPT INST, V316, P149

[4] BRAGG DIFFRACTORS WITH GRADED-THICKNESS MULTILAYERS [J].

NAGEL, DJ ;

GILFRICH, JV ;

BARBEE, TW .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2) :63-65

[5]

PIANNETTA P, COMMUNICATION

[6]

SPIELMAN RB, UNPUB J APPL PHYS

[7]

Spiller E., 1981, AIP C P, V75, P124

[8]

STRADLING GL, 1981, AIP C P, V75, P292

[9]

TOTH LE, 1971, TRANSITION METAL CAR, P135