INSITU DETERMINATION OF OPTICAL AND ELECTRICAL-PROPERTIES OF THIN-FILMS DURING THEIR DEPOSITION

被引：10

作者：

GADENNE, P ^{[1
]}

VUYE, G ^{[1
]}

机构：

[1] UNIV PARIS 06, CNRS, OPT SOLIDES LAB, F-75230 PARIS 05, FRANCE

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1977年 / 10卷 / 07期

关键词：

D O I：

10.1088/0022-3735/10/7/018

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：733 / 736

页数：4

共 11 条

[1]

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BARNA, PB ;

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[3] STUDY ON GROWTH OF THIN-LAYERS USING OPTICAL AND ELECTRICAL MEASUREMENTS DURING THEIR DEPOSITION [J].

GADENNE, P .

THIN SOLID FILMS, 1977, 42 (03) :369-381

[4]

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[5]

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[7] GROWTH + STRUCTURE OF GOLD + SILVER DEPOSITS FORMED BY EVAPORATION INSIDE ELECTRON MICROSCOPE [J].

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STOWELL, MJ ;

LAW, TJ .

PHILOSOPHICAL MAGAZINE, 1964, 10 (103) :127-&

[8] Investigation of the optical properties of Au by means of thin semitransparent films [J].

Theye, Marie-Luce .

PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (08) :3060-3078

[9]

THEYE ML, 1968, THESIS U P M CURIE

[10] OPTICAL-CONSTANTS OF AGGREGATED GOLD-FILMS [J].

TRUONG, VV ;

SCOTT, GD .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (02) :124-131

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