ELEMENTAL SENSITIVITIES OF METALS IN X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：21

作者：

JANGHORBANI, M ^{[1
]}

VULLI, M ^{[1
]}

STARKE, K ^{[1
]}

机构：

[1] PHILIPPS UNIV MARBURG,FB 14 KERNCHEM,MARBURG,FED REP GER

来源：

ANALYTICAL CHEMISTRY | 1975年 / 47卷 / 13期

关键词：

D O I：

10.1021/ac60363a027

中图分类号：

O65 [分析化学];

学科分类号：

070302 [分析化学]; 081704 [应用化学];

摘要：

引用

页码：2200 / 2208

页数：9

共 11 条

[1]

RELATIVE PHOTOELECTRON SIGNAL INTENSITIES OBTAINED WITH A MAGNESIUM X-RAY SOURCE [J].

BERTHOU, H ;

JORGENSEN, CK .

ANALYTICAL CHEMISTRY, 1975, 47 (03) :482-488

[2]

APPLICATION OF ESCA TO ANALYTICAL-CHEMISTRY .1. ELECTROCHEMICAL CONCENTRATION OF METALS FOR TRACE QUANTITATIVE-ANALYSIS BY ESCA [J].

BRINEN, JS ;

MCCLURE, JE .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (03) :243-248

[3]

APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES [J].

BRUNDLE, CR .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :212-224

[4]

EXPERIMENTAL EVALUATION OF A SIMPLE MODEL FOR QUANTITATIVE-ANALYSIS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

CARTER, WJ ;

SCHWEITZER, GK ;

CARLSON, TA .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :827-835

[5]

EBEL H, 1973, XRAY SPECTROM, V2, P19

[6]

TRACE-ELEMENT DETERMINATION WITH SEMICONDUCTOR DETECTOR X-RAY SPECTROMETERS [J].

GIAUQUE, RD ;

GOULDING, FS ;

JAKLEVIC, JM ;

PEHL, RH .

ANALYTICAL CHEMISTRY, 1973, 45 (04) :671-681

[7]

Henke B.L., 1974, ADV XRAY ANALYSIS, V17, P150

[8]

ELECTRON SPECTROSCOPY (ESCA) - USE FOR TRACE ANALYSIS [J].

HERCULES, DM ;

COX, LE ;

ONISICK, S ;

NICHOLS, GD ;

CARVER, JC .

ANALYTICAL CHEMISTRY, 1973, 45 (11) :1973-1975

[9]

MCMASTER WH, 1969, UCRL50174S2

[10]

VULLI M, UNPUBLISHED WORK

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