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MEASUREMENT OF SURFACE-ROUGHNESS PROPERTIES BY USING IMAGE SPECKLE CONTRAST
被引:71
作者
:
FUJII, H
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
FUJII, H
[
1
]
ASAKURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
ASAKURA, T
[
1
]
SHINDO, Y
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
SHINDO, Y
[
1
]
机构
:
[1]
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
来源
:
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA
|
1976年
/ 66卷
/ 11期
关键词
:
D O I
:
10.1364/JOSA.66.001217
中图分类号
:
O4 [物理学];
学科分类号
:
0702 ;
摘要
:
引用
收藏
页码:1217 / 1222
页数:6
相关论文
共 15 条
[11]
STATISTICAL PROPERTIES OF SPECKLE INTENSITY VARIATIONS IN DIFFRACTION FIELD UNDER ILLUMINATION OF COHERENT LIGHT
OHTSUBO, J
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO,HOKKAIDO,JAPAN
OHTSUBO, J
ASAKURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO,HOKKAIDO,JAPAN
ASAKURA, T
[J].
OPTICS COMMUNICATIONS,
1975,
14
(01)
: 30
-
34
[12]
Ohtsubo J., 1975, Bulletin of the Research Institute of Applied Electricity, V27, P18
[13]
OBJECT-ROUGHNESS DEPENDENCE OF PARTIALLY DEVELOPED SPECKLE PATTERNS IN COHERENT LIGHT
PEDERSEN, HM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV TRONDHEIM, NORWEGIAN INST TECHNOL, DEPT PHYS, N-7034 TRONDHEIM, NORWAY
UNIV TRONDHEIM, NORWEGIAN INST TECHNOL, DEPT PHYS, N-7034 TRONDHEIM, NORWAY
PEDERSEN, HM
[J].
OPTICS COMMUNICATIONS,
1976,
16
(01)
: 63
-
67
[14]
ROUGHNESS DEPENDENCE OF PARTIALLY DEVELOPED, MONOCHROMATIC SPECKLE PATTERNS
PEDERSEN, HM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV TRONDHEIM,NORWEGIAN INST TECHNOL,DEPT PHYS,7034 TRONDHEIM,NORWAY
UNIV TRONDHEIM,NORWEGIAN INST TECHNOL,DEPT PHYS,7034 TRONDHEIM,NORWAY
PEDERSEN, HM
[J].
OPTICS COMMUNICATIONS,
1974,
12
(02)
: 156
-
159
[15]
SURFACE-ROUGHNESS MEASUREMENT USING WHITE-LIGHT SPECKLE
SPRAGUE, RA
论文数:
0
引用数:
0
h-index:
0
SPRAGUE, RA
[J].
APPLIED OPTICS,
1972,
11
(12):
: 2811
-
&
←
1
2
→
共 15 条
[11]
STATISTICAL PROPERTIES OF SPECKLE INTENSITY VARIATIONS IN DIFFRACTION FIELD UNDER ILLUMINATION OF COHERENT LIGHT
OHTSUBO, J
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO,HOKKAIDO,JAPAN
OHTSUBO, J
ASAKURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO,HOKKAIDO,JAPAN
ASAKURA, T
[J].
OPTICS COMMUNICATIONS,
1975,
14
(01)
: 30
-
34
[12]
Ohtsubo J., 1975, Bulletin of the Research Institute of Applied Electricity, V27, P18
[13]
OBJECT-ROUGHNESS DEPENDENCE OF PARTIALLY DEVELOPED SPECKLE PATTERNS IN COHERENT LIGHT
PEDERSEN, HM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV TRONDHEIM, NORWEGIAN INST TECHNOL, DEPT PHYS, N-7034 TRONDHEIM, NORWAY
UNIV TRONDHEIM, NORWEGIAN INST TECHNOL, DEPT PHYS, N-7034 TRONDHEIM, NORWAY
PEDERSEN, HM
[J].
OPTICS COMMUNICATIONS,
1976,
16
(01)
: 63
-
67
[14]
ROUGHNESS DEPENDENCE OF PARTIALLY DEVELOPED, MONOCHROMATIC SPECKLE PATTERNS
PEDERSEN, HM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV TRONDHEIM,NORWEGIAN INST TECHNOL,DEPT PHYS,7034 TRONDHEIM,NORWAY
UNIV TRONDHEIM,NORWEGIAN INST TECHNOL,DEPT PHYS,7034 TRONDHEIM,NORWAY
PEDERSEN, HM
[J].
OPTICS COMMUNICATIONS,
1974,
12
(02)
: 156
-
159
[15]
SURFACE-ROUGHNESS MEASUREMENT USING WHITE-LIGHT SPECKLE
SPRAGUE, RA
论文数:
0
引用数:
0
h-index:
0
SPRAGUE, RA
[J].
APPLIED OPTICS,
1972,
11
(12):
: 2811
-
&
←
1
2
→