EPITHERMAL EFFECTS IN POSITRON DEPTH PROFILING MEASUREMENTS

被引:37
作者
BRITTON, DT [1 ]
RICEEVANS, PC [1 ]
EVANS, JH [1 ]
机构
[1] UKAEA,HARWELL LAB,DIV MAT DEV,HARWELL OX11 0RA,BERKS,ENGLAND
关键词
D O I
10.1080/09500838808203766
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:165 / 169
页数:5
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