SCREENING OF IMPURITIES IN SEMICONDUCTORS - MUONIUM IN GERMANIUM, SILICON, AND DIAMOND

被引：21

作者：

MANNINEN, M ^{[1
]}

MEIER, PF ^{[1
]}

机构：

[1] UNIV ZURICH,INST PHYS,CH-8001 ZURICH,SWITZERLAND

来源：

PHYSICAL REVIEW B | 1982年 / 26卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.26.6690

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6690 / 6695

页数：6

共 28 条

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