ION-BOMBARDMENT INDUCED PHOTON AND AUGER EMISSION FOR SURFACE-ANALYSIS

被引：53

作者：

THOMAS, EW

机构：

[1] Georgia Inst of Technology, Sch of, Physics, Atlanta, GA, USA, Georgia Inst of Technology, Sch of Physics, Atlanta, GA, USA

来源：

VACUUM | 1984年 / 34卷 / 12期

关键词：

D O I：

10.1016/0042-207X(84)90221-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

104

引用

页码：1031 / 1044

页数：14

共 106 条

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