ION-BEAM-INDUCED RADIATION APPLIED TO INVESTIGATIONS OF THIN SURFACE-LAYERS ON GLASS SUBSTRATES

被引：23

作者：

BACH, H ^{[1
]}

机构：

[1] JENAER GLASWERK SCHOTT & GEN,65 MAINZ,FED REP GER

来源：

关键词：

D O I：

10.1016/0022-3093(75)90070-8

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：65 / 74

页数：10

共 42 条

[1] ION MICROPROBE MASS ANALYZER
ANDERSEN, CA
HINTHORNE, JR
[J]. SCIENCE, 1972, 175 (4024) : 853 - +
[2] ANDERSEN N, 1973, 3RD INT C AT COLL SO
[3] PHOTON EMISSION INTENSITY AND SPUTTERING EFFICIENCY RELATED TO DRIFT MECHANISMS BELOW ION-BEAM BOMBARDED SURFACES OF NA2O.NSIO2 GLASSES
BACH, H
[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1975, 25 (03): : 209 - 212
[4] SPUTTERING YIELDS AND SPECIFIC ENERGY-LOSSES OF NOBLE GAS-IONS OF 5.6 KEV AT SIO2 GLASS
BACH, H
[J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (02): : 333 - &
[5] MEASUREMENT OF ION CONCENTRATION PROFILES IN SURFACE LAYERS OF LEACHED (SWOLLEN) GLASS ELECTRODE MEMBRANES BY MEANS OF LUMINESCENCE EXCITED BY ION SPUTTERING
BACH, H
BAUCKE, FGK
[J]. ELECTROCHIMICA ACTA, 1971, 16 (08) : 1311 - &
[6] BACH H, 1974, PHYS CHEM GLASSES, V15, P123
[7] FURTHER EXPERIMENTS ON ENERGY-TRANSFER FROM BOMBARDING IONS TO NA2O CONTAINING GLASSES
BACH, H
[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1974, 23 (03): : 213 - 214
[8] BACH H, 1970, Z ANGEW PHYSIK, V28, P239
[9] BACH H, TO BE PUBLISHED
[10] BACH H, 1971, 9TH INT C GLASS VERS, V1, P155