ION-BEAM-INDUCED RADIATION APPLIED TO INVESTIGATIONS OF THIN SURFACE-LAYERS ON GLASS SUBSTRATES

被引：23

作者：

BACH, H ^{[1
]}

机构：

[1] JENAER GLASWERK SCHOTT & GEN,65 MAINZ,FED REP GER

来源：

关键词：

D O I：

10.1016/0022-3093(75)90070-8

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：65 / 74

页数：10

共 42 条

[21] Jurela Z., 1973, International Journal of Mass Spectrometry and Ion Physics, V12, P33, DOI 10.1016/0020-7381(73)80084-1
[22] BOMBARDMENT-INDUCED PHOTON EMISSION FROM A1 AND A12O3 TARGETS
KELLY, R
KERKDIJK, CB
[J]. SURFACE SCIENCE, 1974, 46 (02) : 537 - 557
[23] PHOTON EMISSION DURING BOMBARDMENT OF SOLIDS WITH ALKALI IONS IN ENERGY RANGE BETWEEN 2 AND 10 KEV
KERKOW, H
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 10 (02): : 501 - &
[24] MAYER JW, 1973, THIN SOLID FILMS, V19, P2509
[25] ION NEUTRALIZATION PROCESSES AT INSULATOR SURFACES AND CONSEQUENT IMPURITY MIGRATION EFFECTS IN SIO2 FILMS
MCCAUGHAN, DV
KUSHNER, RA
MURPHY, VT
[J]. PHYSICAL REVIEW LETTERS, 1973, 30 (13) : 614 - 617
[26] LOW-ENERGY ION-BOMBARDMENT OF SILICON DIOXIDE FILMS ON SILICON
MCCAUGHAN, DV
MURPHY, VT
[J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (05) : 2008 - 2017
[27] ION-BEAM SPUTTERING - EFFECT OF INCIDENT ION ENERGY ON ATOMIC MIXING IN SUBSURFACE LAYERS
MCHUGH, JA
[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1974, 21 (04): : 209 - 215
[28] ORSTED HC, 7315 PHYS LAB 2 MON
[29] PEARSE RWB, 1950, IDENTIFICATION MOLEC
[30] SCHAEFFER HF, TO BE PUBLISHED