INVESTIGATION OF AUGENI CONTACTS USING RECTANGULAR AND CIRCULAR TRANSMISSION-LINE MODEL

被引：31

作者：

AHMAD, M ^{[1
]}

ARORA, BM ^{[1
]}

机构：

[1] TATA INST FUNDAMENTAL RES,BOMBAY 400005,INDIA

来源：

SOLID-STATE ELECTRONICS | 1992年 / 35卷 / 10期

关键词：

D O I：

10.1016/0038-1101(92)90080-V

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The effect of sheet resistance of the contact metal on the contact resistance measurement has been explored using circular-geometry transmission-line structures. Ohmic contacts of AuGeNi and Au Ge Ni Pd Au combination were investigated by using electrical and X-ray diffraction measurements.

引用

页码：1441 / 1445

页数：5

共 7 条

[1] MODELS FOR CONTACTS TO PLANAR DEVICES [J].