PERCOLATION-THRESHOLD AND MEAN GRAIN-SIZE IN ALXSI1-X THIN-FILMS

被引：5

作者：

REISS, G

VANCEA, J

HOFFMANN, H

机构：

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1985年 / 18卷 / 21期

关键词：

D O I：

10.1088/0022-3719/18/21/006

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：L657 / L660

页数：4

共 8 条

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[3]

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[5]

REISS G, UNPUB THIN FILMS

[6] ELECTRICAL-CONDUCTION IN GRANULAR CU-SIO2 FILMS [J].

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[7] MEAN FREE-PATH AND EFFECTIVE DENSITY OF CONDUCTION ELECTRONS IN POLYCRYSTALLINE METAL-FILMS [J].

VANCEA, J ;

HOFFMANN, H ;

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THIN SOLID FILMS, 1984, 121 (03) :201-216

[8] ORDERED STRUCTURES IN AMORPHOUS FE-B-ALLOYS [J].

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HOFFMANN, H .

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1984, 45 (2-3) :382-388

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