REFRACTIVE-INDEXES OF SEMICONDUCTOR-FILMS MEASURED BY WAVE-GUIDE CUTOFF SPECTROSCOPY

被引:3
作者
MORASCA, S
SORDO, B
DEBERNARDI, C
MELIGA, M
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10.1063/1.99091
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O59 [应用物理学];
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页码:1593 / 1595
页数:3
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SOLID-STATE ELECTRONICS, 1987, 30 (01) :73-83
[3]   SCALING RULES FOR THIN-FILM OPTICAL-WAVEGUIDES [J].
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[4]  
MELIGA M, 1987, IN PRESS SPIE P C, V835