MULTIPLE REFLECTION CELLS FOR INTERNAL REFLECTION SPECTROMETRY

[1] SURFACE STUDIES BY SPECTRAL ANALYSIS OF INTERNALLY REFLECTED INFRARED RADIATION - HYDROGEN ON SILICON [J]. JOURNAL OF CHEMICAL PHYSICS, 1963, 38 (12) : 2942 - &

[2] DERMATIS SN, 1962, 62514 C PAP WINT M A

[3] ATTENUATED TOTAL REFLECTION - A NEW PRINCIPLE FOR THE PRODUCTION OF USEFUL INFRA-RED REFLECTION SPECTRA OF ORGANIC COMPOUNDS [J]. SPECTROCHIMICA ACTA, 1961, 17 (07): : 698 - +

[4] ON THE DETERMINATION OF OPTICAL CONSTANTS IN THE INFRARED BY ATTENUATED TOTAL REFLECTION [J]. SPECTROCHIMICA ACTA, 1962, 18 (09): : 1103 - &

[5] A NEW SPECTROPHOTOMETRIC TECHNIQUE USING MULTIPLE ATTENUATED TOTAL REFLECTION [J]. ANALYTICAL CHEMISTRY, 1963, 35 (06) : 765 - &

[6] SURFACE CHEMISTRY FROM SPECTRAL ANALYSIS OF TOTALLY INTERNALLY REFLECTED RADIATION [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1960, 64 (09) : 1110 - 1114

[7] HARRICK NJ, 1963, ANN NY ACAD SCI, V101, P928

[8] OPTICAL SPECTRUM OF SEMICONDUCTOR SURFACE STATES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW, 1962, 125 (04): : 1165 - &

[9] STUDY OF PHYSICS AND CHEMISTRY OF SURFACES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW LETTERS, 1960, 4 (05) : 224 - 226

[10] FIBER OPTICS .4. A PHOTOREFRACTOMETER [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (12) : 1109 - 1117

[1] SURFACE STUDIES BY SPECTRAL ANALYSIS OF INTERNALLY REFLECTED INFRARED RADIATION - HYDROGEN ON SILICON [J]. JOURNAL OF CHEMICAL PHYSICS, 1963, 38 (12) : 2942 - &

[2] DERMATIS SN, 1962, 62514 C PAP WINT M A

[3] ATTENUATED TOTAL REFLECTION - A NEW PRINCIPLE FOR THE PRODUCTION OF USEFUL INFRA-RED REFLECTION SPECTRA OF ORGANIC COMPOUNDS [J]. SPECTROCHIMICA ACTA, 1961, 17 (07): : 698 - +

[4] ON THE DETERMINATION OF OPTICAL CONSTANTS IN THE INFRARED BY ATTENUATED TOTAL REFLECTION [J]. SPECTROCHIMICA ACTA, 1962, 18 (09): : 1103 - &

[5] A NEW SPECTROPHOTOMETRIC TECHNIQUE USING MULTIPLE ATTENUATED TOTAL REFLECTION [J]. ANALYTICAL CHEMISTRY, 1963, 35 (06) : 765 - &

[6] SURFACE CHEMISTRY FROM SPECTRAL ANALYSIS OF TOTALLY INTERNALLY REFLECTED RADIATION [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1960, 64 (09) : 1110 - 1114

[7] HARRICK NJ, 1963, ANN NY ACAD SCI, V101, P928

[8] OPTICAL SPECTRUM OF SEMICONDUCTOR SURFACE STATES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW, 1962, 125 (04): : 1165 - &

[9] STUDY OF PHYSICS AND CHEMISTRY OF SURFACES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW LETTERS, 1960, 4 (05) : 224 - 226

[10] FIBER OPTICS .4. A PHOTOREFRACTOMETER [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (12) : 1109 - 1117