CHARACTERIZATION OF REORDERED (001) AU SURFACES BY POSITIVE-ION-CHANNELING SPECTROSCOPY, LEED, AND AES

被引：57

作者：

ZEHNER, DM ^{[1
]}

APPLETON, BR ^{[1
]}

NOGGLE, TS ^{[1
]}

MILLER, JW ^{[1
]}

BARRETT, JH ^{[1
]}

JENKINS, LH ^{[1
]}

SCHOW, OE ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,SOLID STATE DIV,OAK RIDGE,TN 37830

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1975年 / 12卷 / 01期

关键词：

D O I：

10.1116/1.568600

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：454 / 457

页数：4

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