INSTRUMENT FOR MEASURING MAGNETOMICROWAVE KERR EFFECT IN SEMICONDUCTORS

被引：26

作者：

BRODWIN, ME

VERNON, RJ

机构：

来源：

关键词：

D O I：

10.1063/1.1718150

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1129 / &

共 7 条

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