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OPTICAL STUDY OF DEPOSITION AND CONVERSION OF NICKEL-HYDROXIDE FILMS
被引:42
作者
:
ORD, JL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
ORD, JL
[
1
]
机构
:
[1]
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
来源
:
SURFACE SCIENCE
|
1976年
/ 56卷
/ 01期
关键词
:
D O I
:
10.1016/0039-6028(76)90462-3
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:413 / 424
页数:12
相关论文
共 9 条
[1]
AN ELLIPSOMETRIC DETERMINATION OF MECHANISM OF PASSIVITY OF NICKEL
BOCKRIS, JO
论文数:
0
引用数:
0
h-index:
0
BOCKRIS, JO
REDDY, AKN
论文数:
0
引用数:
0
h-index:
0
REDDY, AKN
RAO, B
论文数:
0
引用数:
0
h-index:
0
RAO, B
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(11)
: 1133
-
&
[2]
Bode H., 1966, ELECTROCHIM ACTA, V11, P1079, DOI DOI 10.1016/0013-4686(66)80045-2
[3]
PROPERTIES OF ANODIC OXIDE-FILMS FORMED IN ANODIZATION OF SILICON-NITRIDE
DELLOCA, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
DELLOCA, CJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(09)
: 1225
-
1230
[4]
OPTICAL STUDY OF GROWTH AND OXIDATION OF NICKEL HYDROXIDE FILMS
HOPPER, MA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
HOPPER, MA
ORD, JL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
ORD, JL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(02)
: 183
-
187
[5]
CIRCUIT DESIGN FOR AN ELECTRONIC SELF-NULLING ELLIPSOMETER
LAYER, HP
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Materials Research, National Bureau of Standards, Washington
LAYER, HP
[J].
SURFACE SCIENCE,
1969,
16
: 177
-
&
[6]
CRYSTALLOGRAPHIC STUDIES ON NICKEL HYDROXIDE AND HIGHER NICKEL OXIDES
MCEWEN, RS
论文数:
0
引用数:
0
h-index:
0
MCEWEN, RS
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1971,
75
(12)
: 1782
-
&
[7]
AN ELLIPSOMETER FOR FOLLOWING FILM GROWTH
ORD, JL
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of Waterloo, Waterloo, Ont.
ORD, JL
[J].
SURFACE SCIENCE,
1969,
16
: 155
-
&
[8]
ANODIC OXIDATION OF PLATINUM - EVIDENCE FOR A HIGH-FIELD IONIC CONDUCTION MECHANISM
ORD, JL
论文数:
0
引用数:
0
h-index:
0
ORD, JL
HO, FC
论文数:
0
引用数:
0
h-index:
0
HO, FC
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(01)
: 46
-
&
[9]
ELLIPSOMETRIC STUDY OF FORMATION OF FILMS ON IRON IN ORTHOPHOSPHATE SOLUTIONS
SZKLARSK.Z
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV, DEPT MET ENGN, COLUMBUS, OH 43210 USA
OHIO STATE UNIV, DEPT MET ENGN, COLUMBUS, OH 43210 USA
SZKLARSK.Z
STAEHLE, RW
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV, DEPT MET ENGN, COLUMBUS, OH 43210 USA
OHIO STATE UNIV, DEPT MET ENGN, COLUMBUS, OH 43210 USA
STAEHLE, RW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(11)
: 1393
-
1401
←
1
→
共 9 条
[1]
AN ELLIPSOMETRIC DETERMINATION OF MECHANISM OF PASSIVITY OF NICKEL
BOCKRIS, JO
论文数:
0
引用数:
0
h-index:
0
BOCKRIS, JO
REDDY, AKN
论文数:
0
引用数:
0
h-index:
0
REDDY, AKN
RAO, B
论文数:
0
引用数:
0
h-index:
0
RAO, B
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(11)
: 1133
-
&
[2]
Bode H., 1966, ELECTROCHIM ACTA, V11, P1079, DOI DOI 10.1016/0013-4686(66)80045-2
[3]
PROPERTIES OF ANODIC OXIDE-FILMS FORMED IN ANODIZATION OF SILICON-NITRIDE
DELLOCA, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
DELLOCA, CJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(09)
: 1225
-
1230
[4]
OPTICAL STUDY OF GROWTH AND OXIDATION OF NICKEL HYDROXIDE FILMS
HOPPER, MA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
HOPPER, MA
ORD, JL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
UNIV WATERLOO,DEPT PHYS,WATERLOO,ONTARIO,CANADA
ORD, JL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(02)
: 183
-
187
[5]
CIRCUIT DESIGN FOR AN ELECTRONIC SELF-NULLING ELLIPSOMETER
LAYER, HP
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Materials Research, National Bureau of Standards, Washington
LAYER, HP
[J].
SURFACE SCIENCE,
1969,
16
: 177
-
&
[6]
CRYSTALLOGRAPHIC STUDIES ON NICKEL HYDROXIDE AND HIGHER NICKEL OXIDES
MCEWEN, RS
论文数:
0
引用数:
0
h-index:
0
MCEWEN, RS
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1971,
75
(12)
: 1782
-
&
[7]
AN ELLIPSOMETER FOR FOLLOWING FILM GROWTH
ORD, JL
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of Waterloo, Waterloo, Ont.
ORD, JL
[J].
SURFACE SCIENCE,
1969,
16
: 155
-
&
[8]
ANODIC OXIDATION OF PLATINUM - EVIDENCE FOR A HIGH-FIELD IONIC CONDUCTION MECHANISM
ORD, JL
论文数:
0
引用数:
0
h-index:
0
ORD, JL
HO, FC
论文数:
0
引用数:
0
h-index:
0
HO, FC
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(01)
: 46
-
&
[9]
ELLIPSOMETRIC STUDY OF FORMATION OF FILMS ON IRON IN ORTHOPHOSPHATE SOLUTIONS
SZKLARSK.Z
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV, DEPT MET ENGN, COLUMBUS, OH 43210 USA
OHIO STATE UNIV, DEPT MET ENGN, COLUMBUS, OH 43210 USA
SZKLARSK.Z
STAEHLE, RW
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV, DEPT MET ENGN, COLUMBUS, OH 43210 USA
OHIO STATE UNIV, DEPT MET ENGN, COLUMBUS, OH 43210 USA
STAEHLE, RW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(11)
: 1393
-
1401
←
1
→