MULTILAYER RELAXATION OF CLEAN AG[001]

被引:55
作者
LI, H [1 ]
QUINN, J [1 ]
LI, YS [1 ]
TIAN, D [1 ]
JONA, F [1 ]
MARCUS, PM [1 ]
机构
[1] IBM CORP,RES CTR,YORKTOWN HTS,NY 10598
来源
PHYSICAL REVIEW B | 1991年 / 43卷 / 09期
关键词
D O I
10.1103/PhysRevB.43.7305
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A low-energy electron-diffraction intensity analysis of data from a clean Ag{001- surface finds no multilayer relaxation, i.e., with DELTA-d(ik) being the change in spacing between layer i and layer k, DELTA-d12 = 0 +/- 0.03 angstrom and DELTA-d23 = 0 +/- 0.03 angstrom. These results are compared with the results of first-principles total-energy calculations and with other recent relaxation determinations on fcc {001- surfaces.
引用
收藏
页码:7305 / 7307
页数:3
相关论文
共 29 条
[1]  
BOHNEN KP, 1991, STRUCTURE SURFACES, V3
[2]  
DAI D, 1990, REV SCI INSTRUM, V61, P1724
[3]  
DAVIS HL, 1983, SURF SCI, V126, pL46
[4]   LAPW CALCULATIONS OF RH(001) SURFACE RELAXATION [J].
FEIBELMAN, PJ ;
HAMANN, DR .
SURFACE SCIENCE, 1990, 234 (03) :377-383
[5]  
FOILES SM, 1986, PHYS REV B, V33, P7983, DOI 10.1103/PhysRevB.33.7983
[6]   NEW TRANSFER-MATRIX METHOD FOR LOW-ENERGY-ELECTRON DIFFRACTION AND OTHER SURFACE ELECTRONIC-STRUCTURE PROBLEMS [J].
JEPSEN, DW .
PHYSICAL REVIEW B, 1980, 22 (12) :5701-5715
[7]   ATOMIC-STRUCTURE OF AN IMPURITY-STABILIZED SI[111] SURFACE - REFINEMENT USING A COMBINED-LAYER METHOD [J].
JEPSEN, DW ;
SHIH, HD ;
JONA, F ;
MARCUS, PM .
PHYSICAL REVIEW B, 1980, 22 (02) :814-824
[8]   LOW-ENERGY-ELECTRON-DIFFRACTION INTENSITIES FROM AG[001] .2. THEORY [J].
JEPSEN, DW ;
MARCUS, PM ;
JONA, F .
PHYSICAL REVIEW B, 1973, 8 (12) :5523-5531
[9]   RELAXATION AT CLEAN METAL-SURFACES [J].
JIANG, P ;
MARCUS, PM ;
JONA, F .
SOLID STATE COMMUNICATIONS, 1986, 59 (05) :275-280
[10]  
Jona F., 1972, PHYS REV, VB5, P3933