MEASUREMENT OF ELECTRON-DIFFUSION LENGTHS IN ITO P-INP BY SURFACE PHOTOCURRENTS

被引：1

作者：

HANAK, T

AHRENKIEL, RK

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 64卷 / 07期

关键词：

D O I：

10.1063/1.341491

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3528 / 3531

页数：4

共 11 条

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