CHARACTERIZATION OF TRANSPASSIVE FILMS ON NICKEL BY SPUTTER PROFILING AND ANGLE RESOLVED AES/XPS

被引：48

作者：

DATTA, M

MATHIEU, HJ

LANDOLT, D

机构：

来源：

APPLIED SURFACE SCIENCE | 1984年 / 18卷 / 03期

关键词：

D O I：

10.1016/0378-5963(84)90317-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：299 / 314

页数：16

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