DETERMINATION OF THE REDUCED THICKNESS OF SURFACE-LAYERS BY MEANS OF THE SUBSTRATE METHOD

[1] ANGULAR-DEPENDENCE OF X-RAY PHOTOELECTRONS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 911 - 920

[2] Ebel H., 1973, Journal of Electron Spectroscopy and Related Phenomena, V2, P277, DOI 10.1016/0368-2048(73)80020-9

[3] Ebel M. F., 1980, Surface and Interface Analysis, V2, P173, DOI 10.1002/sia.740020504

[4] DETERMINATION OF REDUCED THICKNESS D-LAMBDA OF THIN-LAYERS BY MEANS OF X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (04) : 287 - 322

[5] EBEL MF, 1979, SURF INTERFACE ANAL, V1, P58

[6] Fadley C. S., 1976, Progress in Solid State Chemistry, V11, P265, DOI 10.1016/0079-6786(76)90013-3

[7] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J]. SURFACE SCIENCE, 1973, 36 (02) : 661 - 674

[8] GUNTNER R, 1976, THESIS TU WIEN

[1] ANGULAR-DEPENDENCE OF X-RAY PHOTOELECTRONS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 911 - 920

[2] Ebel H., 1973, Journal of Electron Spectroscopy and Related Phenomena, V2, P277, DOI 10.1016/0368-2048(73)80020-9

[3] Ebel M. F., 1980, Surface and Interface Analysis, V2, P173, DOI 10.1002/sia.740020504

[4] DETERMINATION OF REDUCED THICKNESS D-LAMBDA OF THIN-LAYERS BY MEANS OF X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (04) : 287 - 322

[5] EBEL MF, 1979, SURF INTERFACE ANAL, V1, P58

[6] Fadley C. S., 1976, Progress in Solid State Chemistry, V11, P265, DOI 10.1016/0079-6786(76)90013-3

[7] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J]. SURFACE SCIENCE, 1973, 36 (02) : 661 - 674

[8] GUNTNER R, 1976, THESIS TU WIEN