DETERMINATION OF REDUCED THICKNESS D-LAMBDA OF THIN-LAYERS BY MEANS OF X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：47

作者：

EBEL, MF

机构：

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1978年 / 14卷 / 04期

关键词：

D O I：

10.1016/0368-2048(78)80005-X

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：287 / 322

页数：36

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