DIRECT OBSERVATION OF SURFACE-PROFILE EFFECTS ON X-RAY-PHOTOELECTRON ANGULAR-DISTRIBUTIONS

被引：32

作者：

BAIRD, RJ ^{[1
]}

FADLEY, CS ^{[1
]}

KAWAMOTO, S ^{[1
]}

MEHTA, M ^{[1
]}

机构：

[1] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822

来源：

CHEMICAL PHYSICS LETTERS | 1975年 / 34卷 / 01期

关键词：

D O I：

10.1016/0009-2614(75)80198-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：49 / 54

页数：6

共 14 条

[1]

BAIRD RJ, IN PRESS

[2] ATTENUATION OF LOW-ENERGY ELECTRONS IN AL2O3 AS DETERMINED BY PHOTOELECTRON-SPECTROSCOPY [J].

BATTYE, FL ;

LIESEGANG, J ;

LECKEY, RCG ;

JENKIN, JG .

PHYSICS LETTERS A, 1974, A 49 (02) :155-156

[3] THEORY OF FORMATION OF VERY THIN OXIDE FILMS ON METALS [J].

BOGGIO, JE ;

PLUMB, RC .

JOURNAL OF CHEMICAL PHYSICS, 1966, 44 (03) :1081-&

[4]

BRUNNER J, 1974, J ELECTRON SPECTROSC, V5, P811

[5] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

FADLEY, CS ;

BAIRD, RJ ;

SIEKHAUS, W ;

NOVAKOV, T ;

BERGSTROM, SA .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) :93-137

[6] ANGULAR DISTRIBUTION OF PHOTOELECTRONS FROM A METAL SINGLE CRYSTAL [J].

FADLEY, CS ;

BERGSTROM, SA .

PHYSICS LETTERS A, 1971, A 35 (05) :375-+

[7] INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J].

FADLEY, CS .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :725-754

[8]

FADLEY CS, 1972, ELECTRON SPECTROSCOP, P233

[9] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J].

FRASER, WA ;

FLORIO, JV ;

DELGASS, WN ;

ROBERTSON, WD .

SURFACE SCIENCE, 1973, 36 (02) :661-674

[10] ULTRASOFT-X-RAY REFLECTION, REFRACTION, AND PRODUCTION OF PHOTOELECTRONS (100-1000-EV REGION) [J].

HENKE, BL .

PHYSICAL REVIEW A, 1972, 6 (01) :94-&

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