TUNNELING MICROSCOPY OF NBSE2 IN AIR

[1] EFFECT OF ATOMIC FORCE ON THE SURFACE CORRUGATION OF 2H-NBSE2 OBSERVED BY SCANNING TUNNELING MICROSCOPY [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1987, 26 (01): : L41 - L43

[2] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61

[3] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834

[4] FELDMAN JL, 1981, J PHYS CHEM SOLIDS, V42, P1029

[5] ELASTIC-CONSTANTS OF 2H-MOS2 AND 2H-NBSE2 EXTRACTED FROM MEASURED DISPERSION CURVES AND LINEAR COMPRESSIBILITIES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1976, 37 (12) : 1141 - 1144

[6] SCANNING TUNNELING MICROSCOPE WITH MICROMETER APPROACH AND THERMAL COMPENSATION [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (08) : 1349 - 1352

[7] VELOCITY OF ULTRASONIC-WAVES IN 2H-NBSE2, 2H-TAS2, AND 1T-TAS2 [J]. PHYSICAL REVIEW B, 1980, 22 (10): : 4907 - 4914

[8] CONTAMINATION-MEDIATED DEFORMATION OF GRAPHITE BY THE SCANNING TUNNELING MICROSCOPE [J]. PHYSICAL REVIEW B, 1986, 34 (12): : 9015 - 9018

[9] PETHICA JB, 1986, IBM J RES DEV, V30, P455

[10] RAO GVS, 1979, PHYSICS CHEM MATERIA, P99

[1] EFFECT OF ATOMIC FORCE ON THE SURFACE CORRUGATION OF 2H-NBSE2 OBSERVED BY SCANNING TUNNELING MICROSCOPY [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1987, 26 (01): : L41 - L43

[2] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61

[3] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834

[4] FELDMAN JL, 1981, J PHYS CHEM SOLIDS, V42, P1029

[5] ELASTIC-CONSTANTS OF 2H-MOS2 AND 2H-NBSE2 EXTRACTED FROM MEASURED DISPERSION CURVES AND LINEAR COMPRESSIBILITIES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1976, 37 (12) : 1141 - 1144

[6] SCANNING TUNNELING MICROSCOPE WITH MICROMETER APPROACH AND THERMAL COMPENSATION [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (08) : 1349 - 1352

[7] VELOCITY OF ULTRASONIC-WAVES IN 2H-NBSE2, 2H-TAS2, AND 1T-TAS2 [J]. PHYSICAL REVIEW B, 1980, 22 (10): : 4907 - 4914

[8] CONTAMINATION-MEDIATED DEFORMATION OF GRAPHITE BY THE SCANNING TUNNELING MICROSCOPE [J]. PHYSICAL REVIEW B, 1986, 34 (12): : 9015 - 9018

[9] PETHICA JB, 1986, IBM J RES DEV, V30, P455

[10] RAO GVS, 1979, PHYSICS CHEM MATERIA, P99