ELECTRON-DIFFRACTION FROM AREAS LESS THAN 3-NM IN DIAMETER

被引:22
作者
GEISS, RH [1 ]
机构
[1] IBM CORP,RES LAB,SAN JOSE,CA 95193
关键词
D O I
10.1063/1.88417
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:174 / 176
页数:3
相关论文
共 5 条
[1]  
RIECKE WD, 1969, Z ANGEW PHYSIK, V27, P155
[2]  
RIECKE WD, 1968, 4TH P EUR REG C EL M, P207
[3]  
RIECKE WD, 1972, 5TH P EUR C EL MICR, P98
[4]   GENERATION AND IDENTIFICATION OF SEM CHANNELLING PATTERNS FROM 10 MUM SELECTED AREAS [J].
VANESSEN, C ;
SCHULSON, EM ;
DONAGHAY, RH .
JOURNAL OF MATERIALS SCIENCE, 1971, 6 (03) :213-&
[5]   NEW SCANNING MICRODIFFRACTION TECHNIQUE [J].
VANOOSTRUM, KJ ;
LEENHOUTS, A ;
JORE, A .
APPLIED PHYSICS LETTERS, 1973, 23 (05) :283-284