DETERMINATION OF CRITICAL CURRENT-DENSITY AND TRANSITION-TEMPERATURE OF YBA2CU3O7-X THIN-FILMS BY MEASUREMENT OF AC SUSCEPTIBILITY

被引：4

作者：

LI, YQ ^{[1
]}

NOH, DW ^{[1
]}

GALLOIS, B ^{[1
]}

TOMPA, GS ^{[1
]}

NORRIS, PE ^{[1
]}

ZAWADZKI, PA ^{[1
]}

机构：

[1] EMCORE, SOMERSET, NJ 08873 USA

来源：

JOURNAL OF APPLIED PHYSICS | 1990年 / 68卷 / 07期

关键词：

D O I：

10.1063/1.346302

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A technique for the determination of the critical current of superconducting thin films by a current-dependent ac susceptibility measurement has been developed. This method has been used to characterize superconducting YBa2 Cu3 O7-x films grown in situ at 1073 K by metalorganic chemical vapor deposition. Two superconducting phases with transition temperatures of 91 and 84 K have been detected by the measurement of ac susceptibility as a function of temperature even though the variation of resistance with temperature indicated a sharp transition. The critical current densities of the two superconducting phases have been determined from the variations of ac susceptibility with current at constant temperature and found to be equal to 1.14×104 A/cm2 and 3.6×10 3 A/cm2 at 75 K. The advantages of the technique in comparison to current methods of measurement of critical current are discussed.

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页码：3775 / 3777

页数：3

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