PREPARATION OF MAGNETIC TIPS FOR A SCANNING FORCE MICROSCOPE

被引：35

作者：

DENBOEF, AJ

机构：

[1] Philips Research Laboratories, 5600 JA Eindhoven

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 20期

关键词：

D O I：

10.1063/1.102991

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A simple technique for peparing magnetic tips used in a scanning force microscope is described. In this technique a thin layer of ferromagnetic material is deposited on an etched tungsten tip via sputtering or galvanic deposition. Images of magnetic domains obtained with these tips are presented, demonstrating a lateral resolution of the order of 50-100 nm.

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页码：2045 / 2047

页数：3

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