INFLUENCE OF ACRT ON INTERFACE STABILITY AND PARTICLE TRAPPING BEHAVIOR IN DIRECTIONAL SOLIDIFICATION OF SILICON

被引:15
作者
RAVISHANKAR, PS [1 ]
DISMUKES, JP [1 ]
WILCOX, WR [1 ]
机构
[1] CLARKSON UNIV,POTSDAM,NY 13676
关键词
D O I
10.1016/0022-0248(85)90364-1
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:579 / 586
页数:8
相关论文
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