RELIABILITY PREDICTION OF SOLID DIELECTRICS USING ELECTRICAL NOISE AS A SCREENING PARAMETER

被引：5

作者：

MISRA, R

PANDEY, S

SUNDARESAN, V

机构：

[1] New Jersey Institute of Technology, Newark

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1991年 / 40卷 / 01期

关键词：

SOLID DIELECTRIC; ELECTRICAL NOISE; LIFE DATA;

D O I：

10.1109/24.75346

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper reports the use of electrical noise for the screening of dielectric sheet material for reliability. Results indicate that high-noise units have a greater failure rate compared to low noise units when subjected to identical voltage and temperature stresses. Solid dielectric sheet materials and small transformers were tested. Measurement of electrical noise in a dielectric will be useful in reliability screening and preventive maintenance. The problem to be solved in a given machine or component, is how to probe for the noise that may be generated at a given spot and then locate that spot precisely.

引用

页码：113 / 116

页数：4

共 10 条

[1]

ANDERSON TW, 1986, STATISTICAL ANAL DAT, P373

[2]

[Anonymous], 1980, REV EQUIPMENT AGING

[3]

CHANG HT, 1984, ACTA SIENTIARUM NATU, P1

[4] RADIO FREQUENCY DIAGNOSTIC MONITORING OF ELECTRICAL MACHINES. [J].

Harrold, R.T. ;

Emery, F.T. .

IEEE Electrical Insulation Magazine, 1986, 2 (02) :18-24

[5]

Mathes K. N., 1985, IEEE Electrical Insulation Magazine, V1, P29, DOI 10.1109/MEI.1985.290312

[6]

Misra R. P., 1987, 14th Inter-RAM: International Reliability, Availability, Maintainibility Conference for the Electric Power Industry

[7] ANALYSIS OF ACCELERATED LIFE TEST DATA .1. ARRHENIUS MODEL AND GRAPHICAL METHODS [J].

NELSON, W .

IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1971, EI 6 (04) :165-&

[8]

SHIRODKAR RD, 1983, THESIS NEW JERSEY I

[9]

SOOMRO M, 1987, THESIS NEW JERSEY I

[10] INTERNAL PARTIAL DISCHARGE AND MATERIAL DEGRADATION [J].

TANAKA, T .

IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1986, 21 (06) :899-905

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