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METHOD FOR MEASURING THE FIELD FROM A MAGNETIC RECORDING HEAD IN THE SCANNING ELECTRON-MICROSCOPE

被引：4
作者：
WELLS, OC
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1983年 / 130卷 / APR期
关键词：
D O I：
10.1111/j.1365-2818.1983.tb04192.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：RP1 / RP2
页数：2
相关论文
共 6 条
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[3]   MAGNETIC FIELD MEASUREMENTS IN SCANNING ELECTRON MICROSCOPE [J].
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[4]   GENERATION AND IDENTIFICATION OF SEM CHANNELLING PATTERNS FROM 10 MUM SELECTED AREAS [J].
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[5]   SCHLIEREN METHOD AS APPLIED TO MAGNETIC RECORDING-HEADS IN THE SCANNING ELECTRON-MICROSCOPE [J].
WELLS, OC ;
BRUNNER, M .
APPLIED PHYSICS LETTERS, 1983, 42 (01) :114-116
[6]  
WELLS OC, 1983, 18TH P ANN C MAS PHO
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