Correction of distorted STM image by using a regular crystalline lattice and 2D FFT

被引:12
作者
Aketagawa, M
Takada, K
机构
[1] Dept. of Mech. Eng., Nagaoka Univ. of Technol., Niigata
关键词
D O I
10.1088/0957-4484/6/4/001
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper presents a practical image-processing method to correct the in-plane geometrical distortion of an STM image, and to calibrate it using a regular crystalline lattice and two-dimensional FFT power spectrum. A dual tunneling unit STM with one X-Y stage and two independently controlled tunneling units in the two Z axes has been proposed for comparative length measurement using a regular crystalline lattice as a reference scale. To improve the measurement accuracy, the present image-processing method is applied to the dual tunneling unit STM and the experimental results, in which highly oriented pyrolytic graphite (HOPG) is used as a reference scale for measurement of the 10-320 nm length, show the feasibility of the present image-processing method and the possibility of comparative length measurement using the dual tunneling unit STM.
引用
收藏
页码:105 / 110
页数:6
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