QUANTITATIVE XPS - MULTILINE APPROACH

被引：51

作者：

HANKE, W

EBEL, H

EBEL, MF

JABLONSKI, A

HIROKAWA, K

机构：

[1] VIENNA TECH UNIV,INST ANGEW & TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA

[2] POLISH ACAD SCI,INST PHYS CHEM,WARSAW 42,POLAND

[3] TOHOKU UNIV,IRON STEEL & OTHER MET RES INST,SENDAI,MIYAGI 980,JAPAN

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1986年 / 40卷 / 03期

关键词：

D O I：

10.1016/0368-2048(86)80023-8

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：241 / 257

页数：17

共 8 条

[1]

CARDONA M, 1978, PHOTOEMISSION SOLIDS, V1, P265

[2]

CRISS JW, 1968, ANAL CHEM, V40, P1077

[3] A MODIFIED BIAS-METHOD FOR THE DETERMINATION OF SPECTROMETER FUNCTIONS [J].

EBEL, H ;

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[4] ON THE INFLUENCE OF ELASTIC-SCATTERING ON ASYMMETRIC XP-SIGNAL DISTRIBUTION [J].

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EBEL, MF ;

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[5] QUANTITATIVE-ANALYSIS BY X-RAY PHOTO-ELECTRON SPECTROSCOPY WITHOUT REFERENCE SAMPLES [J].

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[6] RELATIVE INTENSITIES IN PHOTOELECTRON-SPECTROSCOPY OF ATOMS AND MOLECULES [J].

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MSEZANE, A ;

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[7] HARTREE-SLATER SUBSHELL PHOTOIONIZATION CROSS-SECTIONS AT 1254 AND 1487EV [J].

SCOFIELD, JH .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (02) :129-137

[8] SUBSHELL PHOTO-IONIZATION CROSS-SECTIONS, ELECTRON MEAN FREE PATHS AND QUANTITATIVE X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

SZAJMAN, J ;

JENKIN, JG ;

LECKEY, RCG ;

LIESEGANG, J .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 19 (04) :393-408

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