ON THE INFLUENCE OF ELASTIC-SCATTERING ON ASYMMETRIC XP-SIGNAL DISTRIBUTION

被引：48

作者：

EBEL, H ^{[1
]}

EBEL, MF ^{[1
]}

JABLONSKI, A ^{[1
]}

机构：

[1] UNIV MUNICH,INST PHYS CHEM,D-8000 MUNICH 2,FED REP GER

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1985年 / 35卷 / 1-2期

关键词：

D O I：

10.1016/0368-2048(85)80049-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：155 / 164

页数：10

共 12 条

[1] NEW TECHNIQUE FOR INVESTIGATION OF ANGULAR-DISTRIBUTION OF PHOTOEMISSION FROM SOLIDS - DEMONSTRATION OF THE EFFECT OF ELASTIC-SCATTERING
BASCHENKO, OA
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NEFEDOV, VI
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1984, 34 (03) : 305 - 308
[2] RELATIVE INTENSITIES IN X-RAY PHOTO-ELECTRON SPECTRA .9. ESTIMATES FOR PHOTO-ELECTRON MEAN FREE PATHS TAKING INTO ACCOUNT ELASTIC COLLISIONS IN A SOLID
BASCHENKO, OA
NEFEDOV, VI
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1982, 27 (02) : 109 - 118
[3] RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .7. THE EFFECT OF ELASTIC-SCATTERING IN A SOLID ON THE ANGULAR-DISTRIBUTION OF PHOTOELECTRONS ESCAPING FROM SAMPLES COVERED WITH THIN-FILMS OF VARIOUS THICKNESSES
BASCHENKO, OA
NEFEDOV, VI
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 21 (02) : 153 - 169
[4] RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .4. EFFECT OF ELASTIC-SCATTERING IN A SOLID ON THE FREE-PATH OF ELECTRONS AND THEIR ANGULAR-DISTRIBUTION
BASCHENKO, OA
NEFEDOV, VI
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 17 (06) : 405 - 420
[5] ANALYTICAL EXPRESSIONS FOR POTENTIALS OF NEUTRAL THOMAS-FERMI-DIRAC ATOMS AND FOR CORRESPONDING ATOMIC SCATTERING FACTORS FOR X RAYS AND ELECTRONS
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STRAND, TG
[J]. JOURNAL OF CHEMICAL PHYSICS, 1963, 39 (09) : 2200 - &
[6] THE INFLUENCE OF ELASTIC-SCATTERING OF ELECTRONS ON MEASURED X-RAY PHOTOELECTRON SIGNALS
EBEL, H
EBEL, MF
WERNISCH, J
JABLONSKI, A
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1984, 34 (04) : 355 - 362
[7] QUANTITATIVE XPS ANALYSIS CONSIDERING ELASTIC-SCATTERING
EBEL, H
EBEL, MF
WERNISCH, J
JABLONSKI, A
[J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) : 140 - 143
[8] Hachenberg O., 1959, ADVAN ELECTRON ELECT, V11, P413
[9] EFFECTS OF ELASTIC PHOTOELECTRON COLLISIONS IN QUANTITATIVE XPS
JABLONSKI, A
EBEL, H
[J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (01) : 21 - 28
[10] KENNEDY DJ, 1972, PHYS REV A, V5, P237

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