EFFECTS OF ELASTIC PHOTOELECTRON COLLISIONS IN QUANTITATIVE XPS

被引:41
作者
JABLONSKI, A [1 ]
EBEL, H [1 ]
机构
[1] VIENNA TECH UNIV,INST ANGEW & TECH PHYS,A-1040 VIENNA,AUSTRIA
关键词
D O I
10.1002/sia.740060104
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:21 / 28
页数:8
相关论文
共 15 条
[1]   RELATIVE INTENSITIES IN X-RAY PHOTO-ELECTRON SPECTRA .9. ESTIMATES FOR PHOTO-ELECTRON MEAN FREE PATHS TAKING INTO ACCOUNT ELASTIC COLLISIONS IN A SOLID [J].
BASCHENKO, OA ;
NEFEDOV, VI .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1982, 27 (02) :109-118
[3]   RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .4. EFFECT OF ELASTIC-SCATTERING IN A SOLID ON THE FREE-PATH OF ELECTRONS AND THEIR ANGULAR-DISTRIBUTION [J].
BASCHENKO, OA ;
NEFEDOV, VI .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 17 (06) :405-420
[4]   ANALYTICAL EXPRESSIONS FOR POTENTIALS OF NEUTRAL THOMAS-FERMI-DIRAC ATOMS AND FOR CORRESPONDING ATOMIC SCATTERING FACTORS FOR X RAYS AND ELECTRONS [J].
BONHAM, RA ;
STRAND, TG .
JOURNAL OF CHEMICAL PHYSICS, 1963, 39 (09) :2200-&
[5]   QUANTITATIVE-ANALYSIS BY X-RAY PHOTO-ELECTRON SPECTROSCOPY WITHOUT REFERENCE SAMPLES [J].
EBEL, MF ;
EBEL, H ;
HIROKAWA, K .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1982, 37 (06) :461-471
[6]   SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
FADLEY, CS ;
BAIRD, RJ ;
SIEKHAUS, W ;
NOVAKOV, T ;
BERGSTROM, SA .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) :93-137
[7]   BACKSCATTERING CORRECTION FOR QUANTITATIVE AUGER ANALYSIS .1. MONTE-CARLO CALCULATIONS OF BACKSCATTERING FACTORS FOR STANDARD MATERIALS [J].
ICHIMURA, S ;
SHIMIZU, R .
SURFACE SCIENCE, 1981, 112 (03) :386-408
[9]   SPATIAL DISTRIBUTION OF BACKSCATTERED ELECTRONS IN SCANNING ELECTRON-MICROSCOPE AND ELECTRON-MICROPROBE [J].
MURATA, K .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (09) :4110-4117
[10]   MONTE CARLO CALCULATIONS ON ELECTRON SCATTERING IN A SOLID TARGET [J].
MURATA, K ;
MATSUKAWA, T ;
SHIMIZU, R .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (06) :678-+