THE INFLUENCE OF ELASTIC-SCATTERING OF ELECTRONS ON MEASURED X-RAY PHOTOELECTRON SIGNALS

被引：16

作者：

EBEL, H ^{[1
]}

EBEL, MF ^{[1
]}

WERNISCH, J ^{[1
]}

JABLONSKI, A ^{[1
]}

机构：

[1] UNIV MUNICH,INST PHYS CHEM,D-8000 MUNICH 2,FED REP GER

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1984年 / 34卷 / 04期

关键词：

D O I：

10.1016/0368-2048(84)80049-3

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：355 / 362

页数：8

共 14 条

[1] DIRECT OBSERVATION OF SURFACE-PROFILE EFFECTS ON X-RAY-PHOTOELECTRON ANGULAR-DISTRIBUTIONS
BAIRD, RJ
FADLEY, CS
KAWAMOTO, S
MEHTA, M
[J]. CHEMICAL PHYSICS LETTERS, 1975, 34 (01) : 49 - 54
[2] RELATIVE INTENSITIES IN X-RAY PHOTO-ELECTRON SPECTRA .9. ESTIMATES FOR PHOTO-ELECTRON MEAN FREE PATHS TAKING INTO ACCOUNT ELASTIC COLLISIONS IN A SOLID
BASCHENKO, OA
NEFEDOV, VI
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1982, 27 (02) : 109 - 118
[3] RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .7. THE EFFECT OF ELASTIC-SCATTERING IN A SOLID ON THE ANGULAR-DISTRIBUTION OF PHOTOELECTRONS ESCAPING FROM SAMPLES COVERED WITH THIN-FILMS OF VARIOUS THICKNESSES
BASCHENKO, OA
NEFEDOV, VI
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 21 (02) : 153 - 169
[4] RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .4. EFFECT OF ELASTIC-SCATTERING IN A SOLID ON THE FREE-PATH OF ELECTRONS AND THEIR ANGULAR-DISTRIBUTION
BASCHENKO, OA
NEFEDOV, VI
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 17 (06) : 405 - 420
[5] QUANTITATIVE XPS ANALYSIS CONSIDERING ELASTIC-SCATTERING
EBEL, H
EBEL, MF
WERNISCH, J
JABLONSKI, A
[J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) : 140 - 143
[6] Ebel M. F., 1980, Surface and Interface Analysis, V2, P173, DOI 10.1002/sia.740020504
[7] FILM THICKNESSES DETERMINED BY X-RAY PHOTOELECTRON-SPECTROSCOPY
EBEL, MF
ZUBA, G
EBEL, H
WERNISCH, J
JABLONSKI, A
[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1984, 39 (05) : 637 - 647
[8] QUANTITATIVE-ANALYSIS BY X-RAY PHOTO-ELECTRON SPECTROSCOPY WITHOUT REFERENCE SAMPLES
EBEL, MF
EBEL, H
HIROKAWA, K
[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1982, 37 (06) : 461 - 471
[9] DETERMINATION OF REDUCED THICKNESS D-LAMBDA OF THIN-LAYERS BY MEANS OF X-RAY PHOTOELECTRON-SPECTROSCOPY
EBEL, MF
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (04) : 287 - 322
[10] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY
FADLEY, CS
BAIRD, RJ
SIEKHAUS, W
NOVAKOV, T
BERGSTROM, SA
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) : 93 - 137

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