QUANTITATIVE XPS ANALYSIS CONSIDERING ELASTIC-SCATTERING

被引：14

作者：

EBEL, H ^{[1
]}

EBEL, MF ^{[1
]}

WERNISCH, J ^{[1
]}

JABLONSKI, A ^{[1
]}

机构：

[1] POLISH ACAD SCI,INST PHYS CHEM,WARSAW 42,POLAND

来源：

SURFACE AND INTERFACE ANALYSIS | 1984年 / 6卷 / 03期

关键词：

D O I：

10.1002/sia.740060307

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：140 / 143

页数：4

共 8 条

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[5]

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[6] THEORETICAL CALCULATION OF FLUORESCENT X-RAY INTENSITIES IN FLUORESCENT X-RAY SPECTROCHEMICAL ANALYSIS [J].

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[7]

ZUBA G, 1983, THESIS TU WIEN

[8]

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