A 16K E2PROM EMPLOYING NEW ARRAY ARCHITECTURE AND DESIGNED-IN RELIABILITY FEATURES

被引：23

作者：

YARON, G ^{[1
]}

PRASAD, SJ ^{[1
]}

EBEL, MS ^{[1
]}

LEONG, BMK ^{[1
]}

机构：

[1] NATL SEMICOND CORP,SANTA CLARA,CA 95051

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1982年 / 17卷 / 05期

关键词：

D O I：

10.1109/JSSC.1982.1051827

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：833 / 841

页数：9

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