AUGER RECOMBINATION + IMPACT IONIZATION INVOLVING TRAPS IN SEMICONDUCTORS

被引:74
作者
LANDSBERG, PT
LAL, P
RHYSROBERTS, C
机构
来源
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON | 1964年 / 84卷 / 5426期
关键词
D O I
10.1088/0370-1328/84/6/311
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:915 / &
相关论文
共 18 条
  • [11] KARPOVA IV, 1962, P INT C PHYS SEM EX, P880
  • [12] ELECTRICAL CONDUCTION IN N-TYPE GERMANIUM AT LOW TEMPERATURES
    KOENIG, SH
    BROWN, RD
    SCHILLING, W
    [J]. PHYSICAL REVIEW, 1962, 128 (04): : 1668 - &
  • [13] AUGER EFFECT INVOLVING RECOMBINATION CENTRES
    LANDSBERG, PT
    RHYSROBERTS, C
    EVANS, DA
    [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1964, 83 (5322): : 325 - &
  • [14] LANDSBERG PT, 1964, INT C SEMICONDUCTORS
  • [15] NAGAE M, 1958, PROG THEOR PHYS, V19, P3
  • [16] POPOV YM, 1958, SOVIET PHYSICS JETP, V8, P348
  • [17] OPTICAL AND IMPACT RECOMBINATION IN IMPURITY PHOTOCONDUCTIVITY IN GERMANIUM AND SILICON
    SCLAR, N
    BURSTEIN, E
    [J]. PHYSICAL REVIEW, 1955, 98 (06): : 1757 - 1760
  • [18] WATSON GN, 1944, THEORY BESSEL FUNCTI, P236