CHARACTERIZATION OF LOW OXIDATION-STATES OF TUNGSTEN AND TUNGSTEN ELECTRODES IN ALCL3-NACL MELTS BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：12

作者：

CAVINATO, AG

MAMANTOV, G

COX, XB

机构：

[1] Univ of Tennessee at Knoxville, Dep, of Chemistry, Knoxville, TN, USA, Univ of Tennessee at Knoxville, Dep of Chemistry, Knoxville, TN, USA

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1985年 / 132卷 / 05期

关键词：

TUNGSTEN CHLORIDE - XPS ANALYSIS;

D O I：

10.1149/1.2114028

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：1136 / 1140

页数：5

共 20 条

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